High throughput imaging with Delmic’s new FAST-EM system
Large-scale electron microscopy projects require powerful and high-throughput solutions, and are currently very complex due to inefficient workflows. In this webinar, we take a closer look at the system that is up to these challenges. Our applications specialist Job Fermie presents Delmic’s upcoming multibeam electron microscope and looks closer at the mechanisms used to rapidly capture data with 64 beams. With this webinar, we want to give you a glimpse of what would be possible for your research with this system and what problems it will help to solve. Finally, Job shows application data acquired in the development prototype.