What you learn

  • the system's set up
  • sample loading and unloading
  • the multibeam's set up, generation and detection

Fast-em technical aspects webinar-250


Delmic multibeam FAST-EM: technical aspects of the system

FAST-EM is a powerful solution for reliable and high throughput electron microscopy, which is designed to make complex and large EM projects simple and efficient. During this webinar our applications specialist Job Fermie shows the system's set up, explains how the samples are handled and how the multibeam is set up, generated and detected. We also give a preview of how the image is formed and what data can be acquired with the system.