What you learn
Technical advances of preparing samples from whole cells using focused-ion-beam milling for cryo-electron tomography
In this Journal club, our hosts Dr. Caspar Jonker and Marit Smeets will discuss the workflow described by Wagner et al. in a protocol named “Preparing samples from whole cells using focused-ion-beam milling for cryo-electron tomography”. We will also dive into the equipment and materials described in the article and discuss which technical advances might make this protocol a little easier in the future.