Register for Integrated CLEM workshop
2 November 2017
Max Planck Institute Bremen
The workshop will serve as an introduction to correlative microscopy and will demonstrate the additional data you gain from CLEM, particularly the benefits of integrated CLEM using the SECOM system. Integrated CLEM combines the labelling power of an optical microscope with the high-resolution structural information offered by an electron microscope.
Attedance is free, but we kindly ask that attendees sign up in advance. You can register using the form to the right.
There will be a morning session with talks and an afternoon with hands-on sessions. Spaces are limited for the hands-on sessions!
9:30 - 10:00 Registration and coffee
10:00 - 10:15 Opening by Noor (DELMIC) & Sten
10:15 - 11:00 Talk about research by Sten or Marcel (MPI Bremen)
11:00 - 11:15 Coffee and Tea break
11:15 - 11:45 Talk by Ben Giepmans (UMCG Groningen)
11:45 - 12:30 Talk by Sangeetha Hari (application specialist DELMIC)
12:30 - 13:30 Lunch with hands-on participants
13:30 - 14:30 Hands-on session. Group 1: A, group 2: B, group 3: C
14:30 - 15:30 Hands-on session. Group 1: B, group 2: C, group 3: A
15:30 - 16:00 Coffee and Tea break
16:00 - 17:00 Hands-on session. Group 1: C, group 2: A, group 3: B
17:30 - Dinner for hands-on participants
C] Tour of facility including Raman system